A probe station is an interface tool to measure the electrical characteristics of your microelectronic device. For example, if you are unable to see the inputs and outputs of your DUT precisely with the naked eye, a probe station is what you need to perform measurements, whether it be a wafer, glass, MEMS etc. However, the station requires a combination of a microscope and micropositioners to facilitate the experiment. When integrated, users can accurately make contact to their devices with probes and measure with electronic meters to see your results.
Everbeing’s offerings are available to suit your every application need, and using our modular solution approach, we can customize a single station to combine your applications into a single package. For instance, you may require high frequency probing with probe card integration
Some details you would need to identify are:
| Chuck Stage | Chuck Up/Down | Microscope Stage | Platen Lift | Platen Fine Adjustment | |
|---|---|---|---|---|---|
| C Series | V | V | - | - | - |
| EB Series | V | V | V | - | - |
| BD Series | V | - | V | V | V |
Comprehensive DC an RF prober with probe card capability. EB offers mechanical feature that assist in probing experience
Extending from the EB series, the additional platen lift allows highly repeatable probing for large scale data analysis.
For frequencies up to 1 THz. These probe stations are tailored to your frequency extenders to effectively minimize signal loss.
Includes a microscope support and chuck stage, and large platen to kick start your probing needs
Our smallest and affordable probe station. All features are minimized without compromise. Available in DC and RF versions.
Controlled environment probe station allows probing down to 77K with liquid nitrogen or high temperature probing up to 1273K